Advanced Physical Inspection Methods for Counterfeit IC Detection
نویسنده
چکیده
The remarkable increase in counterfeit parts (a factor of 4 since 2009) [1] is a huge reliability and security concern in various industries ranging from automotive electronics to sensitive military applications increasing the possibility of premature failure in critical systems [2-5]. Counterfeit parts can also incur a great financial loss to legitimate electronics companies [6]. The issue is even more alarming as the counterfeiters use more sophisticated methods making counterfeit detection a much harder task [7-8]. Therefore, it is reasonable to develop more advanced counterfeit detection methods targeting a more efficient detection of sophisticated counterfeited parts.
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